Intel Computer Drive SSDSC2CW240A310 User Manual

Intel® Solid-State Drive 520 Series  
Product Specification  
Capacity: 60/120/180/240/480 GB  
Power Management  
— 5 V SATA Supply Rail  
— SATA Link Power Management (LPM)  
Components:  
®
— Intel 25nm NAND Flash Memory  
— Multi-Level Cell (MLC)  
Form Factor: 2.5-inch  
Thickness: 7 mm and 9.5 mm  
— 7 mm: 120/180/240 GB  
— 9.5 mm: 60/120/180/240/480 GB  
Weight: Up to 78 grams  
Power  
— Active (MobileMark* 2007 Workload):  
850 mW (TYP)  
— Idle: 600 mW (TYP)  
Temperature  
o
o
— Operating: 0 C to 70 C  
— Non-Operating: -55 C to 95 C  
Reliability  
o
o
1
SATA 6Gb/s Bandwidth Performance  
(Iometer* Queue Depth 32)  
— Uncorrectable Bit Error Rate (UBER):  
— Sustained Sequential Read: Up to 550 MB/s  
— Sustained Sequential Write:Up to 520 MB/s  
16  
< 1 sector per 10 bits read  
— Mean Time Between Failures (MTBF):  
1,200,000 hours  
Shock (operating and non-operating):  
1,500 G/0.5 msec  
Vibration  
— Operating: 2.17 G  
— Non-operating: 3.13 G  
Certifications and Declarations:  
1
Read and Write IOPS  
(Iometer Queue Depth 32)  
— Random 4 KB Reads: Up to 50,000 IOPS  
— Random 4 KB Writes: Up to 80,000 IOPS  
Latency (average sequential)  
— Read: 80 µs (TYP)  
— Write: 85 µs (TYP)  
Data Compression  
2
(5-700 Hz)  
RMS  
(5-800 Hz)  
RMS  
— UL*  
— CE*  
— C-Tick*  
— BSMI*  
— KCC*  
— Microsoft* WHQL  
— VCCI*  
AES 256-bit Encryption  
End-to-End Data Protection  
Compatibility  
®
®
— Intel SSD Toolbox with Intel SSD Optimizer  
®
— Intel Data Migration Software  
®
— Intel Rapid Storage Technology  
®
— Intel 6 Series Express Chipsets  
— SATA-IO*  
Product Ecological Compliance  
— RoHS*  
(with SATA 6Gb/s)  
— SATA Revision 3.0  
— ACS-2  
— SSD-enhanced SMART ATA feature set  
— Native Command Queuing (NCQ)  
command set  
— Data Set Management Command  
Trim attribute  
1. Performance values vary by capacity.  
2. Random 4 KB writes measured using out-of-box SSD.  
Order Number: 325968-001US  
February 2012  
 
®
Intel Solid-State Drive 520 Series  
Contents  
1.0 Overview...................................................................................................................5  
2.0 Product Specifications ...............................................................................................6  
3.0 Mechanical Information........................................................................................... 11  
4.0 Pin and Signal Descriptions ..................................................................................... 13  
5.0 Supported Command Sets........................................................................................ 15  
6.0 Certifications and Declarations................................................................................ 22  
7.0 References .............................................................................................................. 23  
8.0 Terms and Acronyms............................................................................................... 23  
9.0 Revision History ...................................................................................................... 24  
IDENTIFY DEVICE Command Data ........................................................................... 25  
®
Intel Solid-State Drive 520 Series  
February 2012  
Order Number: 325968-001US  
Product Specification  
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®
Intel Solid-State Drive 520 Series  
®
Intel Solid-State Drive 520 Series  
Product Specification  
4
February 2012  
Order Number: 325968-001US  
 
®
Intel Solid-State Drive 520 Series  
1.0  
Overview  
®
This document describes the specifications and capabilities of the Intel Solid-State  
®
1
Drive 520 Series (Intel SSD 520 Series) .  
The Intel SSD 520 Series delivers leading performance for Serial Advanced Technology  
Attachment (SATA)-based computers in capacities ranging up to 480 GB.  
By combining Intel's leading 25nm NAND flash memory technology with SATA 6Gb/s  
interface support, the Intel SSD 520 Series delivers sequential read speeds of up to  
550 MB/s and sequential write speeds of up to 520 MB/s.  
The industry-standard 2.5-inch form factor enables interchangeability with existing  
hard disk drives (HDDs) and native SATA HDD drop-in replacement with the enhanced  
performance, reliability, and ruggedness offered by an SSD.  
As compared to standard SATA HDDs, Intel SSD 520 Series offers these key features:  
• High I/O and throughput performance  
• Increased system responsiveness  
• High reliability  
• Enhanced ruggedness  
The Intel SSD 520 Series also offers additional key features such as:  
• Advanced Encryption Standard (AES) 256-bit Encryption  
AES 256-bit encryption is an industry standard in data security, providing a  
hardware-based mechanism for encryption and decryption of user data. Utilizing a  
256-bit encryption key, AES encryption — when combined with an ATA drive  
password — helps protect user data.  
• End-to-End Data Protection  
End-to-end data protection helps protect data from being corrupted across the data  
path by using cyclic redundancy check (CRC), parity, and error correction code  
(ECC) checks in the data path from the host interface to the NAND, and back.  
• Data Compression  
Data compression helps improve performance and endurance by automatically  
compressing information sent to the SSD so that less data has to be processed and  
stored on the NAND. The amount of data that can be compressed depends on the  
type of data.  
1. The Intel SSD 520 Series is currently not validated for data center usage.  
®
Intel Solid-State Drive 520 Series  
February 2012  
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Product Specification  
5
 
 
®
Intel Solid-State Drive 520 Series  
2.0  
Product Specifications  
2.1  
Capacity  
Table 1.  
User Addressable Sectors  
Unformatted Capacity  
(Total User Addressable Sectors in LBA Mode)  
Intel SSD 520 Series  
60 GB  
120 GB  
180 GB  
240 GB  
480 GB  
117,231,408  
234,441,648  
351,651,888  
468,862,128  
937,703,088  
Notes: 1 GB = 1,000,000,000 bytes; 1 sector = 512 bytes.  
LBA count shown represents total user storage capacity and will remain the same throughout the life of the drive.  
The total usable capacity of the SSD may be less than the total physical capacity because a small portion of the capacity is  
used for NAND flash management and maintenance purposes.  
2.2  
Performance  
The data compression engine in the Intel SSD 520 Series controller optimizes  
performance based on the data pattern of the workload.  
This section provides both compressible and incompressible Input/Output Operations  
Per Second (IOPS) and sustained sequential read and write bandwidth specifications.  
Table 2.  
Compressible Performance  
Intel SSD 520 Series  
180 GB  
Specification  
Unit  
60 GB  
120 GB  
240 GB  
480 GB  
Random 4 KB Read (up to)  
IOPS  
IOPS  
IOPS  
15,000  
80,000  
23,000  
25,000  
80,000  
40,000  
50,000  
80,000  
60,000  
50,000  
80,000  
60,000  
50,000  
50,000  
42,000  
1
Random 4 KB Write (up to)  
2
Random 4 KB Write (TYP)  
3
Sequential Read (up to)  
SATA 6Gb/s  
SATA 3Gb/s  
MB/s  
MB/s  
550  
280  
550  
280  
550  
280  
550  
280  
550  
280  
3
Sequential Write (up to)  
SATA 6Gb/s  
SATA 3Gb/s  
475  
245  
500  
260  
520  
260  
520  
260  
520  
260  
Notes:  
1.  
2.  
Random 4 KB write performance measured using out-of-box SSD.  
Performance measured using Iometer* with Queue Depth 32. Measurements are performed on  
8 GB of Logical Block Address (LBA) range on a full SSD.  
3.  
Performance measured using Iometer with Queue Depth 32.  
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Intel Solid-State Drive 520 Series  
Table 3.  
Incompressible Performance  
Intel SSD 520 Series  
180 GB  
Specification  
Unit  
60 GB  
120 GB  
240 GB  
480 GB  
1
1
1
1
1
12,000  
18,000  
24,000  
35,000  
46,000  
56,000  
46,000  
56,000  
46,000  
56,000  
Random 4 KB Read (up to)  
Random 4 KB Write (up to)  
Sequential Read (up to)  
Sequential Write (up to)  
IOPS  
IOPS  
MB/s  
MB/s  
2
2
2
2
2
1
1
1
1
1
6,900  
13,000  
42,000  
13,000  
54,000  
16,500  
60,000  
9,500  
2
2
2
2
2
22,000  
36,000  
1
1
1
1
1
430  
475  
550  
515  
550  
485  
550  
515  
550  
500  
2
2
2
2
2
1
1
1
1
1
80  
85  
150  
170  
170  
240  
235  
295  
275  
235  
2
2
2
2
2
Notes:  
1.  
Performance measured using Iometer with Queue Depth 32. Measurements are performed on  
8 GB of Logical Block Address (LBA) range.  
2.  
Performance measured with incompressible data using AS-SSD* benchmark, where  
MB/s = 1,048,576 bytes/second.  
Table 4.  
Latency  
Intel SSD 520 Series  
180 GB  
Specification  
60 GB  
120 GB  
240 GB  
480 GB  
1
Latency  
Read  
Write  
Power On To Ready  
80 µs (TYP)  
85 µs (TYP)  
2 s (TYP)  
2
Notes: 1. Based on sequential 4 KB using Iometer with Queue Depth 1 workload with compressible (non-random) data pattern.  
Write Cache Enabled.  
2. Power On To Ready time assumes proper shutdown.  
®
Intel Solid-State Drive 520 Series  
February 2012  
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Product Specification  
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®
Intel Solid-State Drive 520 Series  
2.3  
Electrical Characteristics  
Table 5.  
Operating Voltage and Power Consumption  
Electrical Characteristics  
Value  
Operating Voltage for 5 V (±5%)  
Min  
Max  
4.75 V  
5.25 V  
Power Consumption (TYP)  
1
Active  
Idle  
850 mW  
600 mW  
2
Notes:  
1.  
2.  
Active power measured during execution of MobileMark* 2007 with SATA Link Power Management (LPM) enabled.  
Idle power defined as SSD at idle with SATA Link Power Management (LPM) enabled.  
2.4  
Environmental Conditions  
Table 6.  
Temperature, Shock, Vibration  
Temperature  
Range  
Case Temperature  
Operating  
o
0 – 70 C  
o
Non-operating  
-55 – 95 C  
1
Temperature Gradient  
Operating  
o
30 (TYP) C/hr  
o
Non-operating  
30 (TYP) C/hr  
Humidity  
Operating  
Non-operating  
5 – 95 %  
5 – 95 %  
Shock and Vibration  
Range  
2
Shock  
Operating  
Non-operating  
1,500 G (Max) at 0.5 msec  
1,500 G (Max) at 0.5 msec  
3
Vibration  
Operating  
Non-operating  
2.17 G  
3.13 G  
(5-700 Hz) Max  
(5-800 Hz) Max  
RMS  
RMS  
Notes:  
1.  
2.  
Temperature gradient measured without condensation.  
Shock specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting screws.  
Stimulus may be applied in the X, Y or Z axis. Shock specification is measured using Root Mean Squared (RMS) value.  
3.  
Vibration specifications assume the SSD is mounted securely with the input vibration applied to the drive-mounting  
screws. Stimulus may be applied in the X, Y or Z axis. Vibration specification is measured using Root Mean Squared (RMS)  
value.  
®
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Product Specification  
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Intel Solid-State Drive 520 Series  
2.5  
Product Regulatory Compliance  
The Intel SSD 520 Series meets or exceeds the regulatory or certification requirements  
in Table 7.  
Table 7.  
Product Regulatory Compliance Specifications  
Region for which  
conformity declared  
Title  
Description  
European Union Low Voltage  
Directive (LVD) 2006/95/EC  
EN 60950-1 2nd edition for Information Technology Equipment -  
Safety - Part 1: General Requirements  
European Union  
UL/CSA 60950-1, Second Edition  
CAN/CSA-C22.2 No. 60950-1-07  
Second Edition  
Information Technology Equipment - Safety - Part 1:  
General Requirements  
USA/Canada  
CFR Title 47 Part 15  
ICES-003 Issue 4  
Radio Frequency Devices - Subpart B (Unintentional Radiators)  
Interference Causing Equipment Standard  
USA  
Canada  
Information technology equipment -  
Radio disturbance characteristics -  
Limits and methods of measurement  
EN 55022:2006  
CNS 14348:2006  
VCCI V3/2010.04  
KN22 (2008-5)  
CISPR 22:2006  
EN 55024:1998  
KN24 (2008-5)  
European Union  
Taiwan  
Information technology equipment -  
Radio disturbance characteristics -  
Limits and methods of measurement  
Information technology equipment -  
Radio disturbance characteristics -  
Limits and methods of measurement  
Japan  
Information technology equipment -  
Radio disturbance characteristics -  
Limits and methods of measurement  
Korea  
Information technology equipment -  
Radio disturbance characteristics -  
Limits and methods of measurement  
International  
European Union  
Korea  
Information technology equipment -  
Immunity characteristics -  
Limits and methods of measurement (CISPR 24:1997, modified)  
Information technology equipment -  
Immunity characteristics -  
Limits and methods of measurement (CISPR 24:1997, modified)  
®
Intel Solid-State Drive 520 Series  
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Product Specification  
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®
Intel Solid-State Drive 520 Series  
2.6  
Reliability  
The Intel SSD 520 Series meets or exceeds SSD endurance and data retention  
requirements as specified in the JESD218 specification.  
Reliability specifications are listed in Table 8.  
Table 8.  
Reliability Specifications  
Parameter  
Value  
Uncorrectable Bit Error Rate (UBER)  
Uncorrectable bit error rate will not exceed one sector in the  
specified number of bits read. In the unlikely event of a  
nonrecoverable read error, the SSD will report it as a read failure to  
the host; the sector in error is considered corrupt and is not  
returned to the host.  
16  
< 1 sector per 10 bits read  
Mean Time Between Failures (MTBF)  
Mean Time Between Failures is estimated based on Telcordia*  
methodology and demonstrated through Reliability Demonstration  
Test (RDT).  
1,200,000 hours  
Minimum Useful Life/Endurance Rating  
5 years  
The SSD will have a minimum of five years of useful life under  
typical client workloads with up to 20 GB of host writes per day.  
Insertion Cycles  
250 insertion/removal cycles  
The SSD supports up to 250 insertion/removal cycles on SATA/  
power cable.  
2.7  
Hot Plug Support  
Hot Plug insertion and removal is supported in the presence of a proper connector and  
appropriate operation system, as described in the SATA 3.0 specification.  
This product supports asynchronous signal recovery and issues an unsolicited COMINIT  
when first mated with a powered connector to guarantee reliable detection by a host  
system without hardware device detection.  
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Intel Solid-State Drive 520 Series  
3.0  
Mechanical Information  
Figure 1 shows the physical package information for the 7mm height 2.5-inch  
Intel SSD 520 Series. All dimensions are in millimeters.  
Figure 1.  
Dimensions for 7mm 2.5-inch Form Factor  
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®
Intel Solid-State Drive 520 Series  
Figure 2 shows the physical package information for the 9.5mm height 2.5-inch  
Intel SSD 520 Series. All dimensions are in millimeters.  
Figure 2.  
Dimensions for 9.5mm 2.5-inch Form Factor  
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Intel Solid-State Drive 520 Series  
4.0  
Pin and Signal Descriptions  
4.1  
Pin Locations  
Figure 3.  
Layout of Signal and Power Segment Pins  
Signal Segment S1  
Power Segment P1  
Note: 2.5-inch connector supports in-built latching capability.  
4.2  
Signal Descriptions  
4.2.1  
Table 9.  
Connector Pin Signal Definitions  
Serial ATA Connector Pin Signal Definitions  
Pin  
Function  
Definition  
S1  
S2  
S3  
S4  
S5  
S6  
S7  
Ground  
A+  
1st mate  
Differential signal pair A  
1st mate  
A-  
Ground  
B-  
Differential signal pair B  
1st mate  
B+  
Ground  
Note: Key and spacing separate signal and power segments.  
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Intel Solid-State Drive 520 Series  
4.2.2  
Power Pin Signal Definitions  
Table 10.  
Serial ATA Power Pin Definitions  
1
Pin  
Name  
Definition  
3.3 V Power; not used  
Mating Order  
2
P1  
V
V
V
2nd Mate  
2nd Mate  
1st Mate  
1st Mate  
1st Mate  
1st Mate  
1st Mate  
2nd Mate  
2nd Mate  
1st Mate  
2nd Mate  
1st Mate  
1st Mate  
2nd Mate  
2nd Mate  
33  
33  
33  
2
P2  
3.3 V Power; not used  
3.3 V Power; not used  
2
P3  
3,4  
P4  
Ground  
Ground  
Ground  
3
P5  
3
P6  
3,5  
P7  
V
V
V
5 V Power  
5 V Power  
5 V Power  
5
5
5
3,5  
P8  
3,5  
P9  
3
P10  
Ground  
DAS  
6
P11  
Device Activity Signal  
3, 4  
P12  
Ground  
2
2
2
P13  
V
V
V
12 V Power; not used  
12 V Power; not used  
12 V Power; not used  
12  
12  
12  
P14  
P15  
Notes:  
1.  
2.  
All pins are in a single row, with a 1.27 mm (0.050-inch) pitch.  
Pins P1, P2 and P3 are connected together; Pins P13, P14 and P15 are connected together. Although they are not  
connected internally to the device, the host may apply voltage on these pins.  
The mating sequence is:  
3.  
Ground pins P4-P6, P10, P12 and the 5V power pin P7.  
Signal pins and the rest of the 5V power pins P8-P9.  
4.  
Ground connectors P4 and P12 may contact before the other 1st mate pins in both the power and signal connectors to  
discharge ESD in a suitably configured backplane connector.  
5.  
6.  
Power pins P7, P8, and P9 are internally connected to one another within the device.  
The host may ground P11 if it is not used for Device Activity Signal (DAS).  
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Intel Solid-State Drive 520 Series  
5.0  
Supported Command Sets  
The Intel SSD 520 Series supports all mandatory Advanced Technology Attachment  
(ATA) and Serial ATA (SATA) commands defined in the ACS-2 and SATA Revision 3.0  
specifications. The mandatory and optional commands are defined in this section.  
5.1  
ATA General Feature Command Set  
General Feature command set (non-PACKET), which consists of:  
• EXECUTE DEVICE DIAGNOSTIC  
• FLUSH CACHE  
• IDENTIFY DEVICE  
Note:  
returned after issuing an IDENTIFY DEVICE command.  
• READ DMA  
• READ SECTOR(S)  
• READ VERIFY SECTOR(S)  
• SEEK  
• SET FEATURES  
• WRITE DMA  
• WRITE SECTOR(S)  
• READ MULTIPLE  
• SET MULTIPLE MODE  
• WRITE MULTIPLE  
The Intel SSD 520 Series also supports the following optional commands:  
• READ BUFFFER  
• WRITE BUFFER  
• NOP  
• DOWNLOAD MICROCODE  
5.2  
Power Management  
The Intel SSD 520 Series supports several power management feature sets as defined  
by the ATA specification: general Power Management feature set, Advanced Power  
Management feature set, and Power-Up In Standby (PUIS) feature set.  
The Advanced Power Management and PUIS features can be enabled or disabled using  
the SET FEATURES command.  
The Power Management feature set includes the following commands:  
• CHECK POWER MODE  
• IDLE  
• IDLE IMMEDIATE  
• SLEEP  
• STANDBY  
• STANDBY IMMEDIATE  
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®
Intel Solid-State Drive 520 Series  
5.3  
Security Mode Feature Set  
The Intel SSD 520 Series supports the Security Mode command set, which consists of:  
• SECURITY SET PASSWORD  
• SECURITY UNLOCK  
• SECURITY ERASE PREPARE  
• SECURITY ERASE UNIT  
• SECURITY FREEZE LOCK  
• SECURITY DISABLE PASSWORD  
5.4  
SMART Command Set  
The Intel SSD 520 Series supports the SMART command set, which consists of:  
• SMART READ DATA  
• SMART READ ATTRIBUTE THRESHOLDS  
• SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE  
• SMART SAVE ATTRIBUTE VALUES  
• SMART EXECUTE OFF-LINE IMMEDIATE  
• SMART READ LOG SECTOR  
• SMART WRITE LOG SECTOR  
• SMART ENABLE OPERATIONS  
• SMART DISABLE OPERATIONS  
• SMART RETURN STATUS  
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5.4.1  
SMART Attributes  
Table 11 lists the SMART attributes supported by the Intel SSD 520 Series; Table 12 on  
page 19 lists the corresponding status flags and threshold settings.  
Table 11.  
SMART Attributes  
1
Status Flags  
ID  
Attribute  
Re-allocated Sector Count  
Threshold  
SP  
EC  
ER  
PE  
OC  
PW  
The raw value of this attribute shows the  
number of retired blocks since leaving the  
factory (grown defect count).  
05h  
1
1
0
0
1
0
0 (none)  
Power-On Hours Count  
The raw value reports two values: the first  
4 bytes report the cumulative number of  
power-on hours over the life of the device,  
the remaining bytes report the number of  
milliseconds since the last hour increment.  
The On/Off status of the Device Initiated  
Power Management (DIPM) feature will  
affect the number of hours reported. If DIPM  
is turned On, the recorded value for  
power-on hours does not include the time  
that the device is in a "slumber" state. If  
DIPM is turned Off, the recorded value for  
power-on hours should match the clock  
time, as all three device states are counted:  
active, idle and slumber.  
09h  
1
1
0
0
1
0
0 (none)  
Power Cycle Count  
The raw value of this attribute reports the  
cumulative number of power cycle events  
over the life of the device.  
0Ch  
AAh  
1
1
1
1
0
0
0
0
1
1
0
1
0 (none)  
10  
Available Reserved Space  
Program Fail Count  
The raw value of this attribute shows total  
count of program fails and the normalized  
value, beginning at 100, shows the percent  
remaining of allowable program fails.  
ABh  
ACh  
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)  
0 (none)  
Erase Fail Count  
The raw value of this attribute shows total  
count of erase fails and the normalized  
value, beginning at 100, shows the percent  
remaining of allowable erase fails.  
Unexpected Power Loss  
The raw value of this attribute reports the  
cumulative number of unsafe (unclean)  
shutdown events over the life of the device.  
An unsafe shutdown occurs whenever the  
device is powered off without STANDBY  
IMMEDIATE being the last command  
AEh  
1
1
0
0
1
0
0 (none)  
End-to-End Error Detection Count  
Reports number of errors encountered  
during end-to-end error detection within the  
SSD data path.  
B8h  
BBh  
1
1
1
1
0
0
0
0
1
1
1
0
90  
Uncorrectable Error Count  
The raw value shows the count of errors  
that could not be recovered using Error  
Correction Code (ECC).  
0 (none)  
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Table 11.  
SMART Attributes (Continued)  
1
Status Flags  
ID  
Attribute  
Threshold  
SP  
EC  
ER  
PE  
OC  
PW  
Power-Off Retract Count (Unsafe Shutdown  
Count)  
The raw value of this attribute reports the  
cumulative number of unsafe (unclean)  
shutdown events over the life of the device.  
An unsafe shutdown occurs whenever the  
device is powered off without STANDBY  
IMMEDIATE being the last command.  
C0h  
1
1
0
0
1
0
0 (none)  
Host Writes  
The raw value of this attribute reports the  
total number of sectors written by the host  
system. The raw value is increased by 1 for  
every 65,536 sectors (32MB) written by  
the host.  
E1h  
E2h  
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)  
0 (none)  
Timed Workload Media Wear  
Measures the wear seen by the SSD (since  
reset of the workload timer, attribute E4h),  
as a percentage of the maximum rated  
cycles.  
Timed Workload Host Read/Write Ratio  
Shows the percentage of I/O operations  
that are read operations (since reset of the  
workload timer, attribute E4h).  
E3h  
E4h  
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)  
0 (none)  
Timed Workload Timer  
Measures the elapsed time (number of  
minutes since starting this workload timer).  
Available Reserved Space  
This attribute reports the number of reserve  
blocks remaining. The normalized value  
begins at 100 (64h), which corresponds to  
100 percent availability of the reserved  
space. The threshold value for this attribute  
is 10 percent availability.  
E8h  
1
1
0
0
1
1
10  
Media Wearout Indicator  
This attribute reports the number of cycles  
the NAND media has undergone. The  
normalized value declines linearly from 100  
to 1 as the average erase cycle count  
increases from 0 to the maximum rated  
cycles.  
Once the normalized value reaches 1, the  
number will not decrease, although it is likely  
that significant additional wear can be put  
on the device.  
E9h  
F1h  
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)  
Total LBAs Written  
The raw value of this attribute reports the  
total number of sectors written by the host  
system. The raw value is increased by 1 for  
every 65,536 sectors (32MB) written by  
the host.  
0 (none)  
Total LBAs Read  
The raw value of this attribute reports the  
total number of sectors read by the host  
system. The raw value is increased by 1 for  
every 65,536 sectors (32MB) read by  
the host.  
F2h  
F9h  
1
1
1
1
0
0
0
0
1
1
0
0
0 (none)  
0 (none)  
Total NAND Writes  
Raw value reports the number of writes to  
NAND in 1 GB increments.  
®
Intel Solid-State Drive 520 Series  
Product Specification  
18  
February 2012  
Order Number: 325968-001US  
 
®
Intel Solid-State Drive 520 Series  
Table 12 defines the SMART Attribute status flags.  
Table 12.  
SMART Attribute Status Flags  
Status  
Description  
Flag  
Value = 0  
Value = 1  
SP  
EC  
ER  
PE  
Self-preserving attribute  
Event count attribute  
Error rate attribute  
Not a self-preserving attribute  
Not an event count attribute  
Not an error rate attribute  
Not a performance attribute  
Self-preserving attribute  
Event count attribute  
Error rate attribute  
Performance attribute  
Performance attribute  
Collected during both offline and  
online activity  
OC  
PW  
Online collection attribute  
Pre-fail warranty attribute  
Collected only during offline activity  
Advisory  
Pre-fail  
5.4.2  
SMART Logs  
The Intel SSD 520 Series implements the following Log Addresses: 00h, 02h, 03h, 06h,  
and 07h.  
The Intel SSD 520 Series implements host vendor specific logs (addresses 80h-9Fh) as  
read and write scratchpads, where the default value is zero (0). Intel SSD 520 Series  
does not write any specific values to these logs unless directed by the host through the  
appropriate commands.  
The Intel SSD 520 Series also implements a device vendor specific log at address A9h  
as a read-only log area with a default value of zero (0).  
5.5  
Device Statistics  
In addition to the SMART attribute structure, statistics pertaining to the operation and  
health of the Intel SSD 520 Series can be reported to the host on request through the  
Device Statistics log as defined in the ATA specification.  
The Device Statistics log is a read-only GPL/SMART log located at read log address  
0x04 and is accessible using READ LOG EXT, READ LOG DMA EXT or SMART READ LOG  
commands.  
Table 13 lists the Device Statistics supported by the Intel SSD 520 Series.  
Table 13.  
Device Statistics Log  
Equivalent SMART attribute if  
Page  
Offset  
Description  
applicable  
0x00  
-
List of Supported Pages  
Power Cycle Count  
Power-On Hours  
-
0x08  
0x10  
0x18  
0Ch  
09h  
E1h  
Logical Sectors Written  
Num Write Commands - incremented  
by one for every host write command  
0x01 - General Statistics  
0x20  
0x28  
0x30  
0x08  
0x10  
-
F2h  
-
Logical Sectors Read  
Num Read Commands - incremented  
by one for every host write command  
Num Reported Uncorrectable Errors  
BBh  
-
0x04 - General Errors Statistics  
0x06 - Transport Statistics  
Num Resets Between Command  
Acceptance and Completion  
0x08  
0x10  
0x18  
Num Hardware Resets  
Num ASR Events  
-
-
-
Num Interface CRC Errors  
®
Intel Solid-State Drive 520 Series  
February 2012  
Order Number: 325968-001US  
Product Specification  
19  
 
       
®
Intel Solid-State Drive 520 Series  
Table 13.  
Device Statistics Log (Continued)  
Equivalent SMART attribute if  
applicable  
Page  
Offset  
Description  
E9h  
This statistic counts up from 0  
rather than down from 100, and  
may go beyond 100 for drives that  
exceed their expected lifetime.  
0x07 - Solid State Device Statistics  
0x08  
Percentage Used Endurance Indicator  
5.6  
SMART Command Transport (SCT)  
With SMART Command Transport (SCT), a host can send commands and data to an  
SSD and receive status and data from an SSD using standard write/read commands to  
manipulate two SMART Logs:  
• Log Address E0h ("SCT Command/Status") — used to send commands and retrieve  
status  
• Log Address E1h ("SCT Data Transfer") — used to transport data  
5.7  
5.8  
Data Set Management Command Set  
The Intel SSD 520 Series supports the Data Set Management command set Trim  
attribute, which consists of:  
• DATA SET MANAGEMENT  
Host Protected Area Command Set  
The Intel SSD 520 Series supports the Host Protected Area command set, which  
consists of:  
• READ NATIVE MAX ADDRESS  
• SET MAX ADDRESS  
• READ NATIVE MAX ADDRESS EXT  
• SET MAX ADDRESS EXT  
5.9  
48-Bit Address Command Set  
The Intel SSD 520 Series supports the 48-bit Address command set, which consists of:  
• FLUSH CACHE EXT  
• READ DMA EXT  
• READ NATIVE MAX ADDRESS  
• READ NATIVE MAX ADDRESS EXT  
• READ SECTOR(S) EXT  
• READ VERIFY SECTOR(S) EXT  
• SET MAX ADDRESS EXT  
• WRITE DMA EXT  
• WRITE MULTIPLE EXT  
• WRITE SECTOR(S) EXT  
®
Intel Solid-State Drive 520 Series  
Product Specification  
20  
February 2012  
Order Number: 325968-001US  
 
       
®
Intel Solid-State Drive 520 Series  
5.10  
5.11  
General Purpose Log Command Set  
The Intel SSD 520 Series supports the General Purpose Log command set, which  
consists of:  
• READ LOG EXT  
• WRITE LOG EXT  
• READ LOG DMA EXT  
• WRITE LOG DMA EXT  
Native Command Queuing  
The Intel SSD 520 Series supports the Native Command Queuing (NCQ) command set,  
which includes:  
• READ FPDMA QUEUED  
• WRITE FPDMA QUEUED  
Note: With a maximum queue depth equal to 32.  
5.12  
5.13  
Software Settings Preservation  
The Intel SSD 520 Series supports the SET FEATURES parameter to enable/disable the  
preservation of software settings.  
SATA Link Power Management (LPM)  
The Intel SSD 520 Series supports the SET FEATURES parameter to enable Device  
Initiated Power Management (DIPM). The SSD also supports Host Initiated Power  
Management (HIPM).  
®
Intel Solid-State Drive 520 Series  
February 2012  
Order Number: 325968-001US  
Product Specification  
21  
 
       
®
Intel Solid-State Drive 520 Series  
6.0  
Certifications and Declarations  
Table 14 describes the Device Certifications supported by the Intel SSD 520 Series.  
Table 14.  
Device Certifications and Declarations  
Certification  
Description  
Low Voltage DIRECTIVE 2006/95/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL  
CE Compliant  
UL Certified  
of 12 December 2006, and EMC Directive 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF  
THE COUNCIL of 15 December 2004.  
Certified Underwriters Laboratories, Inc. Bi-National Component Recognition; UL 60950-1, 2nd  
Edition, 2007-03-27 (Information Technology Equipment - Safety - Part 1: General Requirements)  
CSA C22.2 No. 60950-1-07, 2nd Edition, 2007-03 (Information Technology Equipment - Safety -  
Part 1: General Requirements)  
Compliance with the Australia/New Zealand Standard AS/NZS3548 and Electromagnetic  
Compatibility (EMC) Framework requirements of the Australian Communication Authority (ACA).  
C-Tick Compliant  
BSMI Compliant  
Compliance to the Taiwan EMC standard CNS 13438: Information technology equipment - Radio  
disturbance Characteristics - limits and methods of measurement, as amended on June 1, 2006, is  
harmonized with CISPR 22: 2005.04.  
Compliance with paragraph 1 of Article 11 of the Electromagnetic Compatibility Control Regulation  
and meets the Electromagnetic Compatibility (EMC) Framework requirements of the Radio Research  
Laboratory (RRL) Ministry of Information and Communication Republic of Korea.  
KCC  
Microsoft WHQL  
RoHS Compliant  
Microsoft Windows Hardware Quality Labs  
Restriction of Hazardous Substance Directive  
Voluntary Control Council for Interface to cope with disturbance problems caused by personal  
computers or facsimile.  
VCCI  
SATA-IO  
Indicates certified logo program from Serial ATA International Organization.  
Applies only to brominated and chlorinated flame retardants (BFRs/CFRs) and PVC in the final  
product. Intel components as well as purchased components on the finished assembly meet JS-709  
requirements, and the PCB/substrate meet IEC 61249-2-21 requirements. The replacement of  
halogenated flame retardants and/or PVC may not be better for the environment.  
Low Halogen  
®
Intel Solid-State Drive 520 Series  
Product Specification  
22  
February 2012  
Order Number: 325968-001US  
 
   
®
Intel Solid-State Drive 520 Series  
7.0  
References  
Table 15 identifies the standards information referenced in this document.  
Table 15.  
Standards References  
Date or  
Rev. #  
Title  
Location  
Solid-State Drive (SSD) Requirements and Endurance Test Method http://www.jedec.org/standards-  
Sept 2010  
Dec 2008  
(JESD218)  
VCCI  
documents/docs/jesd218/  
June 2009  
RoHS  
Click Search MDDS Database and search  
for material description datasheet  
August 2009  
June 2009  
May 2006  
May 2005  
ACS-2 Specification  
Serial ATA Revision 3.0  
SFF-8223, 2.5-inch Drive w/Serial Attachment Connector  
SFF-8201, 2.5-inch drive form factor  
Compliance with EN 55022:1998 Information technology  
equipment - Radio disturbance characteristics - Limits and  
methods of measurement CISPR 22:1997 (Modified)  
8.0  
Terms and Acronyms  
Table 16 defines the terms and acronyms used in this document.  
Table 16.  
Glossary of Terms and Acronyms  
Term  
Definition  
ATA  
Advanced Technology Attachment  
Device Activity Signal  
DAS  
DIPM  
DMA  
EXT  
Device Initiated Power Management  
Direct Memory Access  
Extended  
FPDMA  
First Party Direct Memory Access  
Gigabyte (1,000,000,000 bytes)  
GB  
Note: The total usable capacity of the SSD may be less than the total physical capacity because a  
small portion of the capacity is used for NAND flash management and maintenance purposes.  
HDD  
HIPM  
I/O  
Hard Disk Drive  
Host Initiated Power Management  
Input/Output  
IOPS  
KB  
Input/Output Operations Per Second  
Kilobyte (1,024 bytes)  
Logical Block Address  
LBA  
LPM  
MB  
Link Power Management  
Megabyte (1,000,000 bytes)  
Multi-level Cell  
MLC  
MTBF  
Mean Time Between Failures  
®
Intel Solid-State Drive 520 Series  
February 2012  
Order Number: 325968-001US  
Product Specification  
23  
 
       
®
Intel Solid-State Drive 520 Series  
Table 16.  
Glossary of Terms and Acronyms (Continued)  
Term  
Definition  
NCQ  
NOP  
PIO  
Native Command Queuing  
No Operation  
Programmed Input/Output  
Reliability Demonstration Test  
Root Mean Squared  
RDT  
RMS  
SATA  
SMART  
SSD  
TYP  
Serial Advanced Technology Attachment  
Self-Monitoring, Analysis and Reporting Technology  
Solid-State Drive  
Typical  
UBER  
Uncorrectable Bit Error Rate  
9.0  
Revision History  
Date  
February 2012  
Revision Description  
001  
Initial release.  
®
Intel Solid-State Drive 520 Series  
Product Specification  
24  
February 2012  
Order Number: 325968-001US  
 
 
®
Intel Solid-State Drive 520 Series  
Appendix A IDENTIFY DEVICE Command Data  
Table 17 details the sector data returned after issuing an IDENTIFY DEVICE command.  
Table 17.  
Returned Sector Data  
F = Fixed  
V = Variable  
X = Both  
Word  
Default Value  
Description  
0
1
F
X
V
X
X
X
V
X
F
0040h  
3FFFh  
C837h  
0010h  
0h  
General configuration bit-significant information  
Obsolete - Number of logical cylinders (16,383)  
Specific configuration  
2
3
Obsolete - Number of logical heads (16)  
Retired  
4-5  
6
003Fh  
0h  
Obsolete - Number of logical sectors per logical track (63)  
Reserved for assignment by the CompactFlash* Association (CFA)  
Retired  
7-8  
9
0h  
10-19  
20-21  
22  
varies  
0h  
Serial number (20 ASCII characters)  
Retired  
X
X
F
0h  
Obsolete  
23-26  
27-46  
varies  
varies  
Firmware revision (8 ASCII characters)  
®
F
Model number (Intel Solid-State Drive)  
7:0—Maximum number of sectors transferred per interrupt on multiple  
commands  
47  
F
8010h  
48  
49  
F
F
F
X
F
X
X
X
X
V
F
X
F
F
F
F
F
F
F
F
F
4000h  
2F00h  
4000h  
0h  
Reserved  
Capabilities  
50  
Capabilities  
51-52  
53  
Obsolete  
0007h  
3FFFh  
0010h  
003Fh  
00FBFC10h  
0110h  
varies  
0h  
Words 88 and 70:64 valid  
54  
Obsolete - Number of logical cylinders (16,383)  
Obsolete - Number of logical heads (16)  
Obsolete - Number of logical sectors per logical track (63)  
Obsolete  
55  
56  
57-58  
59  
Number of sectors transferred per interrupt on multiple commands  
Total number of user-addressable sectors  
Obsolete  
60-61  
62  
63  
0007h  
0003h  
0078h  
0078h  
0078h  
0078h  
4000h  
0h  
Multi-word DMA modes supported/selected  
PIO modes supported  
64  
65  
Minimum multiword DMA transfer cycle time per word  
Manufacturer’s recommended multiword DMA transfer cycle time  
Minimum PIO transfer cycle time without flow control  
Minimum PIO transfer cycle time with IORDY flow control  
Additional Supported  
66  
67  
68  
69  
70  
Reserved  
71-74  
0h  
Reserved for IDENTIFY PACKET DEVICE command  
®
Intel Solid-State Drive 520 Series  
February 2012  
Order Number: 325968-001US  
Product Specification  
25  
 
   
®
Intel Solid-State Drive 520 Series  
Table 17.  
Returned Sector Data (Continued)  
F = Fixed  
V = Variable  
X = Both  
Word  
Default Value  
Description  
75  
76  
77  
78  
79  
80  
81  
82  
83  
84  
85  
86  
87  
88  
89  
90  
91  
92  
F
F
F
F
V
F
F
F
F
F
V
V
V
V
F
F
V
V
001Fh  
470Eh  
0006h  
004Ch  
0040h  
03FCh  
0110h  
746Bh  
7469h  
6163h  
7469h  
B449h  
6163h  
407Fh  
0002h  
0001h  
00FEh  
FFFEh  
Queue depth  
Serial ATA capabilities  
Reserved for future Serial ATA definition  
Serial ATA features supported  
Serial ATA features enabled  
Major version number  
Minor version number  
Command set supported  
Command sets supported  
Command set/feature supported extension  
Command set/feature enabled  
Command set/feature enabled  
Command set/feature default  
Ultra DMA Modes  
Time required for security erase unit completion  
Time required for enhanced security erase completion  
Current advanced power management value  
Master Password Revision Code  
Hardware reset result: the contents of bits (12:0) of this word shall  
change only during the execution of a hardware reset  
93  
F
0h  
94  
95  
V
F
V
V
F
V
V
F
F
F
F
F
V
F
F
F
F
F
V
X
0h  
0h  
Vendor’s recommended and actual acoustic management value  
Stream minimum request size  
Streaming transfer time - DMA  
Streaming access latency - DMA and PIO  
Streaming performance granularity  
Maximum user LBA for 48-bit address feature set  
Streaming transfer time - PIO  
96  
0h  
97  
0h  
98-99  
100-103  
104  
0h  
varies  
0h  
105  
0001h  
4000h  
0h  
Reserved  
106  
Physical sector size / logical sector size  
Inter-seek delay for ISO-7779 acoustic testing in microseconds  
Unique ID  
107  
108-111  
112-115  
116  
varies  
0h  
Reserved for world wide name extension to 128 bits  
Reserved for technical report  
0h  
117-118  
119  
0h  
Words per logical sector  
401Ch  
401Ch  
0h  
Supported settings  
120  
Command set/feature enabled/supported  
Reserved  
121-126  
127  
0h  
Removable Media Status Notification feature set support  
Security status  
128  
0021h  
varies  
129-159  
Vendor-specific  
®
Intel Solid-State Drive 520 Series  
Product Specification  
26  
February 2012  
Order Number: 325968-001US  
 
®
Intel Solid-State Drive 520 Series  
Table 17.  
Returned Sector Data (Continued)  
F = Fixed  
V = Variable  
X = Both  
Word  
Default Value  
Description  
160  
161-168  
169  
F
X
X
F
0h  
0h  
CompactFlash Association (CFA) power mode 1  
Reserved for assignment by the CFA  
Data set management Trim attribute support  
Additional Product Identifier  
Reserved  
0001h  
0h  
170-173  
174-175  
176-205  
206  
F
0h  
V
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
0h  
Current media serial number  
SCT Command Transport  
0021h  
0h  
207-208  
209  
Reserved  
4000h  
0h  
Alignment of logical blocks within a physical block  
Write-Read-Verify Sector Count Mode 3 (DWord)  
Write-Read-Verify Sector Count Mode 2 (DWord)  
NV Cache Capabilities  
210-211  
212-213  
214  
00000100h  
0h  
215-216  
217  
0h  
NV Cache Size in Logical Blocks (DWord)  
Nominal media rotation rate  
Reserved  
0001h  
0h  
218  
219  
0h  
NV Cache Options  
220  
0h  
Write-Read-Verify feature set  
Reserved  
221  
0h  
222  
103Fh  
0h  
Transport major version number  
Transport minor version number  
Reserved  
223  
224-229  
230-233  
0h  
0h  
Extended Number of User Addressable Sectors (QWord)  
Minimum number of 512-byte data blocks per DOWNLOAD MICROCODE  
command for mode 03h  
234  
235  
X
X
0h  
0h  
Maximum number of 512-byte data blocks per DOWNLOAD MICROCODE  
command for mode 03h  
236-254  
255  
X
X
0h  
Reserved  
varies  
Integrity word  
Notes: F = Fixed. The content of the word is fixed and does not change. For removable media devices, these values may change  
when media is removed or changed.  
V = Variable. The state of at least one bit in a word is variable and may change depending on the state of the device or  
the commands executed by the device.  
X = F or V. The content of the word may be fixed or variable.  
®
Intel Solid-State Drive 520 Series  
February 2012  
Order Number: 325968-001US  
Product Specification  
27  
 

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